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Veranstaltungen Industrielle Messtechnik
ZEISS Innovation Day: Surface Finish Metrology
Datum
10.10.2018
Ort
USA / Dayton, OH
Aussteller
This informative session will cover how to deal with the R parameters pertaining to surface roughness, including averaging, Peak to Valley, Slope, Spacing, Counting and Bearing Area Curve. Industry expert, Mark C. Malburg, Ph.D. will lead this session.